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Integrated Circuit Defect-Sensitivity: Theory and Computational Models - The Springer International Series in Engineering and Computer Science Softcover reprint of the original 1st ed. 1993 edition
Jose Pineda de Gyvez
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Integrated Circuit Defect-Sensitivity: Theory and Computational Models - The Springer International Series in Engineering and Computer Science Softcover reprint of the original 1st ed. 1993 edition
Jose Pineda de Gyvez
The expectation was that many small design companies would share the investment into the extremely costful Silicon fabrication plants while designing large lots of application-specific integrated circuits (ASIC's).
191 pages, 48 black & white illustrations, biography
| Media | Bøker Pocketbok (Bok med mykt omslag og limt rygg) |
| Utgitt | 23. februar 2014 |
| ISBN13 | 9781461363835 |
| Utgivere | Springer-Verlag New York Inc. |
| Antall sider | 167 |
| Mål | 155 × 235 × 11 mm · 281 g |
| Språk | Engelsk |
Se alt med Jose Pineda de Gyvez ( f.eks. Innbunden bok og Pocketbok )