Advances in Imaging and Electron Physics: Theory of Intense Beams of Charged Particles - Advances in Imaging and Electron Physics - - Bøker - Elsevier Science Publishing Co Inc - 9780123813107 - 21. juni 2011
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Advances in Imaging and Electron Physics: Theory of Intense Beams of Charged Particles - Advances in Imaging and Electron Physics

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Advances in Imaging and Electron Physics: Theory of Intense Beams of Charged Particles - Advances in Imaging and Electron Physics

Features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in these domains.

752 pages

Media Bøker     Innbunden bok   (Bok med hard rygg og stivt omslag)
Utgitt 21. juni 2011
ISBN13 9780123813107
Utgivere Elsevier Science Publishing Co Inc
Antall sider 752
Mål 152 × 229 × 40 mm   ·   1,17 kg
Serieredaktør Hawkes, Peter W. (Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America; member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics)