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Failure Analysis of Integrated Circuits: Tools and Techniques - The Springer International Series in Engineering and Computer Science 1999 edition
Lawrence C Wagner
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Failure Analysis of Integrated Circuits: Tools and Techniques - The Springer International Series in Engineering and Computer Science 1999 edition
Lawrence C Wagner
This "must have" reference work for semiconductor professionals and researchers provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits.
255 pages, biography
| Media | Bøker Innbunden bok (Bok med hard rygg og stivt omslag) |
| Utgitt | 31. januar 1999 |
| ISBN13 | 9780412145612 |
| Utgivere | Chapman and Hall |
| Antall sider | 255 |
| Mål | 155 × 235 × 17 mm · 589 g |
| Språk | Engelsk |
| Redaktør | Wagner, Lawrence C. |
Se alt med Lawrence C Wagner ( f.eks. Innbunden bok og Pocketbok )