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Analog and Mixed-Signal Boundary-Scan: A Guide to the IEEE 1149.4 Test Standard - Frontiers in Electronic Testing 1999 edition
Adam Osseiran
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Analog and Mixed-Signal Boundary-Scan: A Guide to the IEEE 1149.4 Test Standard - Frontiers in Electronic Testing 1999 edition
Adam Osseiran
Testing of a system does not follow directly from the testing of its parts, and a system built with testable parts can sometimes be impossible to test. Even if all digital chips are compliant with the standard, the testability of a mixed-signal system cannot be guaranteed.
156 pages, biography
| Media | Bøker Innbunden bok (Bok med hard rygg og stivt omslag) |
| Utgitt | 31. oktober 1999 |
| ISBN13 | 9780792386865 |
| Utgivere | Springer |
| Antall sider | 156 |
| Mål | 156 × 234 × 11 mm · 426 g |
| Redaktør | Osseiran, Adam |
![Cover for Adam Osseiran · Analog and Mixed-signal Boundary-scan: a Guide to the Ieee 1149.4 Test Standard (Pocketbok) [Softcover Reprint of Hardcover 1st Ed. 1999 edition] (2010)](https://imusic.b-cdn.net/images/item/original/151/9781441951151.jpg?adam-osseiran-2010-analog-and-mixed-signal-boundary-scan-a-guide-to-the-ieee-1149-4-test-standard-pocketbok&class=scaled&v=1609519059)