Integrated Circuit Defect-Sensitivity: Theory and Computational Models - The Springer International Series in Engineering and Computer Science - Jose Pineda de Gyvez - Bøker - Springer - 9780792393061 - 31. desember 1992
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Integrated Circuit Defect-Sensitivity: Theory and Computational Models - The Springer International Series in Engineering and Computer Science 1993 edition

Jose Pineda de Gyvez

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Integrated Circuit Defect-Sensitivity: Theory and Computational Models - The Springer International Series in Engineering and Computer Science 1993 edition

The expectation was that many small design companies would share the investment into the extremely costful Silicon fabrication plants while designing large lots of application-specific integrated circuits (ASIC's).

167 pages, 48 black & white illustrations, biography

Media Bøker     Innbunden bok   (Bok med hard rygg og stivt omslag)
Utgitt 31. desember 1992
ISBN13 9780792393061
Utgivere Springer
Antall sider 167
Mål 155 × 235 × 12 mm   ·   453 g
Språk Engelsk  

Se alt med Jose Pineda de Gyvez ( f.eks. Innbunden bok og Pocketbok )