Test and Diagnosis of Analogue, Mixed-signal and Rf Integrated Circuits: the System on Chip Approach - Materials, Circuits and Devices - - Bøker - Institution of Engineering and Technolog - 9780863417450 - 30. mai 2008
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Test and Diagnosis of Analogue, Mixed-signal and Rf Integrated Circuits: the System on Chip Approach - Materials, Circuits and Devices

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Test and Diagnosis of Analogue, Mixed-signal and Rf Integrated Circuits: the System on Chip Approach - Materials, Circuits and Devices

This book provides a comprehensive discussion of automatic testing, diagnosis and tuning of analogue, mixed-signal and RF integrated circuits, and systems in a single source. The book reports systematically the state of the arts and future research directions of those areas.

408 pages, Illustrations

Media Bøker     Pocketbok   (Bok med mykt omslag og limt rygg)
Utgitt 30. mai 2008
ISBN13 9780863417450
Utgivere Institution of Engineering and Technolog
Antall sider 408
Mål 159 × 232 × 23 mm   ·   612 g
Redaktør Sun, Yichuang