Advanced Materials Characterization: Basic Principles, Novel Applications, and Future Directions - Advanced Materials Processing and Manufacturing - Kumar, Ch Sateesh (University of Johannesburg, South Africa) - Bøker - Taylor & Francis Ltd - 9781032375113 - 29. november 2024
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Kumar, Ch Sateesh (University of Johannesburg, South Africa)

Advanced Materials Characterization: Basic Principles, Novel Applications, and Future Directions - Advanced Materials Processing and Manufacturing

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The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. Major instruments covered include X-Ray Diffraction, NSOM Raman, X-Ray Photo Spectroscopy, UV-VIS- NIR Spectrosphotometer, FTIR Spectroscopy, and so forth.

130 pages, 52 Line drawings, black and white; 5 Halftones, black and white; 57 Illustrations, black

Media Bøker     Pocketbok   (Bok med mykt omslag og limt rygg)
Utgitt 29. november 2024
ISBN13 9781032375113
Utgivere Taylor & Francis Ltd
Antall sider 130
Mål 234 × 156 × 11 mm   ·   238 g
Språk Engelsk  
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