Next Generation HALT and HASS: Robust Design of Electronics and Systems - Quality and Reliability Engineering Series - Kirk A. Gray - Bøker - John Wiley & Sons Inc - 9781118700235 - 23. mai 2016
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Next Generation HALT and HASS: Robust Design of Electronics and Systems - Quality and Reliability Engineering Series 1. utgave

Kirk A. Gray

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Next Generation HALT and HASS: Robust Design of Electronics and Systems - Quality and Reliability Engineering Series 1. utgave

Next Generation HALT and HASS presents a major paradigm shift from reliability prediction-based methods to discovery of electronic systems reliability risks.


300 pages

Media Bøker     Innbunden bok   (Bok med hard rygg og stivt omslag)
Utgitt 23. mai 2016
ISBN13 9781118700235
Utgivere John Wiley & Sons Inc
Antall sider 296
Mål 236 × 161 × 19 mm   ·   498 g
Språk Engelsk