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Radiation-induced Soft Error: A Chip-level Modeling - Foundations and Trends (R) in Electronic Design Automation
Norbert Seifert
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Radiation-induced Soft Error: A Chip-level Modeling - Foundations and Trends (R) in Electronic Design Automation
Norbert Seifert
A simulation-based methodology of chip-level radiation-induced soft error rates that is fast and reasonably accurate is crucial to the reliability and success of a final product. This book summarises selected publications that are deemed relevant by the author to enable a truly chip-level radiation-induced soft error rate estimation methodology.
136 pages
| Media | Bøker Pocketbok (Bok med mykt omslag og limt rygg) |
| Utgitt | 27. november 2010 |
| ISBN13 | 9781601983947 |
| Utgivere | now publishers Inc |
| Antall sider | 136 |
| Mål | 157 × 234 × 8 mm · 199 g |
| Språk | Engelsk |
Se alt med Norbert Seifert ( f.eks. Pocketbok )