An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science - IOP Concise Physics - Sarah Fearn - Bøker - Morgan & Claypool Publishers - 9781643279107 - 16. oktober 2015
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An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science - IOP Concise Physics

Sarah Fearn

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An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science - IOP Concise Physics

66 pages

Media Bøker     Innbunden bok   (Bok med hard rygg og stivt omslag)
Utgitt 16. oktober 2015
ISBN13 9781643279107
Utgivere Morgan & Claypool Publishers
Antall sider 66
Mål 340 g