Fortell venner om denne varen:
Introduction to Focused Ion Beam Nanometrology - IOP Concise Physics
David C. Cox
Pris
NOK 1.119
Bestillingsvarer
Forventes levert 22. - 31. okt
Legg til iMusic ønskeliste
eller
Introduction to Focused Ion Beam Nanometrology - IOP Concise Physics
David C. Cox
This book describes modern focused ion beam microscopes and techniques and how they can be used to aid materials metrology and as tools for the fabrication of devices that in turn are used in many other aspects of fundamental metrology.
104 pages
| Media | Bøker Pocketbok (Bok med mykt omslag og limt rygg) |
| Utgitt | 1. oktober 2015 |
| ISBN13 | 9781681740201 |
| Utgivere | Morgan & Claypool Publishers |
| Antall sider | 104 |
| Mål | 253 × 178 × 8 mm · 163 g |
| Språk | Engelsk |
