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An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science - IOP Concise Physics
Sarah Fearn
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An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science - IOP Concise Physics
Sarah Fearn
Highlights the application of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) for high-resolution surface analysis and characterization of materials. While providing a brief overview of the principles of SIMS, it also provides examples of how dual-beam ToF-SIMS is used to investigate a range of materials systems and properties.
66 pages, colour illustrations
Media | Bøker Pocketbok (Bok med mykt omslag og limt rygg) |
Utgitt | 16. oktober 2015 |
ISBN13 | 9781681740249 |
Utgivere | Morgan & Claypool Publishers |
Antall sider | 66 |
Mål | 177 × 256 × 8 mm · 181 g |
Språk | Engelsk |
Se alt med Sarah Fearn ( f.eks. Innbunden bok og Pocketbok )