An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science - IOP Concise Physics - Sarah Fearn - Bøker - Morgan & Claypool Publishers - 9781681740249 - 16. oktober 2015
Ved uoverensstemmelse mellom cover og tittel gjelder tittel

An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science - IOP Concise Physics

Sarah Fearn

Pris
zł 161,90

Bestillingsvarer

Forventes levert 25. jul - 5. aug
Legg til iMusic ønskeliste
Eller

An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science - IOP Concise Physics

Highlights the application of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) for high-resolution surface analysis and characterization of materials. While providing a brief overview of the principles of SIMS, it also provides examples of how dual-beam ToF-SIMS is used to investigate a range of materials systems and properties.


66 pages, colour illustrations

Media Bøker     Pocketbok   (Bok med mykt omslag og limt rygg)
Utgitt 16. oktober 2015
ISBN13 9781681740249
Utgivere Morgan & Claypool Publishers
Antall sider 66
Mål 177 × 256 × 8 mm   ·   181 g
Språk Engelsk