Electrical Atomic Force Microscopy for Nanoelectronics - - Bøker - Springer Nature Switzerland AG - 9783030156114 - 24. august 2019
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Electrical Atomic Force Microscopy for Nanoelectronics 1st ed. 2019 edition

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The tremendous impact of electronic devices on our lives is the result of continuous improvements of the billions of nanoelectronic components inside integrated circuits (ICs). This book reviews the latest progress in IC devices, with emphasis on the impact of electrical atomic force microscopy (AFM) techniques for their development.

408 pages, 60 Tables, color; 230 Illustrations, color; 26 Illustrations, black and white; XX, 408 p.

Media Bøker     Bok
Utgitt 24. august 2019
ISBN13 9783030156114
Utgivere Springer Nature Switzerland AG
Antall sider 408
Mål 150 × 220 × 20 mm   ·   805 g
Språk Tysk  
Redaktør Celano, Umberto