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Intrinsic Point Defects, Impurities, and Their Diffusion in Silicon - Computational Microelectronics Softcover reprint of the original 1st ed. 2004 edition
Peter Pichler
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Intrinsic Point Defects, Impurities, and Their Diffusion in Silicon - Computational Microelectronics Softcover reprint of the original 1st ed. 2004 edition
Peter Pichler
This book contains the first comprehensive review of intrinsic point defects, impurities and their complexes in silicon.
554 pages, 40 black & white illustrations, biography
| Media | Bøker Pocketbok (Bok med mykt omslag og limt rygg) |
| Utgitt | 1. november 2012 |
| ISBN13 | 9783709172049 |
| Utgivere | Springer Verlag GmbH |
| Antall sider | 554 |
| Mål | 178 × 254 × 30 mm · 1,01 kg |
| Språk | Engelsk |
