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Fundamentals of Bias Temperature Instability in MOS Transistors: Characterization Methods, Process and Materials Impact, DC and AC Modeling - Springer Series in Advanced Microelectronics 1st ed. 2015 edition
Souvik Mahapatra
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Fundamentals of Bias Temperature Instability in MOS Transistors: Characterization Methods, Process and Materials Impact, DC and AC Modeling - Springer Series in Advanced Microelectronics 1st ed. 2015 edition
Souvik Mahapatra
269 pages, 133 black & white illustrations, 68 colour illustrations, 17 black & white tables, biogra
| Media | Bøker Innbunden bok (Bok med hard rygg og stivt omslag) |
| Utgitt | 14. august 2015 |
| ISBN13 | 9788132225072 |
| Utgivere | Springer, India, Private Ltd |
| Antall sider | 269 |
| Mål | 155 × 235 × 20 mm · 689 g |
| Redaktør | Mahapatra, Souvik |
Se alt med Souvik Mahapatra ( f.eks. Innbunden bok )