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Fundamentals of Bias Temperature Instability in MOS Transistors: Characterization Methods, Process and Materials Impact, DC and AC Modeling - Springer Series in Advanced Microelectronics Softcover reprint of the original 1st ed. 2016 edition
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Fundamentals of Bias Temperature Instability in MOS Transistors: Characterization Methods, Process and Materials Impact, DC and AC Modeling - Springer Series in Advanced Microelectronics
269 pages, 17 Tables, black and white; 67 Illustrations, color; 134 Illustrations, black and white;
| Media | Bøker Pocketbok (Bok med mykt omslag og limt rygg) |
| Utgitt | 23. oktober 2016 |
| ISBN13 | 9788132234241 |
| Utgivere | Springer, India, Private Ltd |
| Antall sider | 269 |
| Mål | 150 × 220 × 10 mm · 493 g |
| Redaktør | Mahapatra, Souvik |