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VLSI Design and Test 1st ed. 2017 edition
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VLSI Design and Test 1st ed. 2017 edition
This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017. The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions.
815 pages, 486 Illustrations, black and white; XXI, 815 p. 486 illus.
| Media | Bøker Bok |
| Utgitt | 22. desember 2017 |
| ISBN13 | 9789811074691 |
| Utgivere | Springer Verlag, Singapore |
| Antall sider | 815 |
| Mål | 1,25 kg |
| Redaktør | Dasgupta, Sudeb |
| Redaktør | Kaushik, Brajesh Kumar |
| Redaktør | Singh, Virendra |