Releases med John Okumu

Cover for John Okumu · Labview Run Four Point Probe Device: Electrical Characterization of Semiconducting Thin Films Made Easy by Four Point Probe System Controlled by Labview (Pocketbok) (2012)
Pocketbok
Labview Run Four Point Probe Dev...
John Okumu
Cover for John Okumu · Electron Impact Excitation of Helium Atom: a Distorted Wave Method Applied to Study the 23s and 23p Excitation of Helium Atom by Electron Impact (Pocketbok) (2010)
Pocketbok
Electron Impact Excitation of He...
John Okumu