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![Cover for Nicola Nicolici · Power-Constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard - Frontiers in Electronic Testing (Innbunden bok) [2003 edition] (2003)](https://imusic.b-cdn.net/images/item/original/352/9781402072352.jpg?nicola-nicolici-2003-power-constrained-testing-of-vlsi-circuits-a-guide-to-the-ieee-1149-4-test-standard-frontiers-in-electronic-testing-innbunden-bok&class=scaled&v=1408497692)