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Releases med Tackhwi Lee

Cover for Tackhwi Lee · Device Characterization of Dy-incorporated Hfo2 Gate Oxide Nmos Device: Device Characteristics and Reliability of Dyo / Hfo Gate Dielectrics and the Application to Nand Flash Memory (Pocketbok) (2011)
Pocketbok
Device Characterization of Dy-in...
Tackhwi Lee