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![Cover for Yusuf Leblebici · Hot-carrier Reliability of Mos Vlsi Circuits - the Springer International Series in Engineering and Computer Science (Pocketbok) [Softcover Reprint of the Original 1st Ed. 1993 edition] (2012)](https://imusic.b-cdn.net/images/item/original/290/9781461364290.jpg?yusuf-leblebici-2012-hot-carrier-reliability-of-mos-vlsi-circuits-the-springer-international-series-in-engineering-and-computer-science-pocketbok&class=scaled&v=1522819387)
![Cover for Yusuf Leblebici · Hot-Carrier Reliability of MOS VLSI Circuits - The Springer International Series in Engineering and Computer Science (Innbunden bok) [1993 edition] (1993)](https://imusic.b-cdn.net/images/item/original/528/9780792393528.jpg?yusuf-leblebici-1993-hot-carrier-reliability-of-mos-vlsi-circuits-the-springer-international-series-in-engineering-and-computer-science-innbunden-bok&class=scaled&v=1410176406)