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VLSI Test Symposium (VTS 2004)
Ieee
The proceedings of the 21st IEEE VLSI test symposium (VTS (2003) describing innovations in the testing of integrated circuits and systems.
| Media | Bøker Pocketbok (Bok med mykt omslag og limt rygg) |
| Utgitt | 2004 |
| ISBN13 | 9780769521343 |
| Utgivere | IEEE Computer Society Press,U.S. |
| Antall sider | 550 |
| Mål | 150 × 220 × 10 mm · 911 g (Estimert vekt) |
| Språk | Engelsk |
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