Adam Foster
Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents - NanoScience and Technology Adam Foster Softcover reprint of hardcover 1st ed. 2006 edition

Name: Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents - NanoScience and Technology
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Author: Adam Foster

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Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents - NanoScience and Technology

Adam Foster

Softcover reprint of hardcover 1st ed. 2006 edition

Scanning Probe Microscopy provides a comprehensive source of information for researchers, teachers, and graduate students about the rapidly expanding field of scanning probe theory.

282 pages, biography

Media	Bøker Pocketbok (Bok med mykt omslag og limt rygg)
Utgitt	23. november 2010
ISBN13	9781441923066
Utgivere	Springer-Verlag New York Inc.
Antall sider	282
Mål	155 × 235 × 16 mm · 417 g
Språk	Engelsk