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Data Mining and Diagnosing IC Fails - Frontiers in Electronic Testing Leendert M. Huisman Softcover reprint of hardcover 1st ed. 2005 edition
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Data Mining and Diagnosing IC Fails - Frontiers in Electronic Testing
Leendert M. Huisman
The second part contains all the mathematical details that are necessary to prove the validity of the analysis techniques, the existence of solutions to the problems that those techniques engender, and the correctness of several properties that were assumed in the first part.
250 pages, 46 black & white illustrations, biography
| Media | Bøker Pocketbok (Bok med mykt omslag og limt rygg) |
| Utgitt | 8. desember 2010 |
| ISBN13 | 9781441937674 |
| Utgivere | Springer-Verlag New York Inc. |
| Antall sider | 250 |
| Mål | 155 × 235 × 14 mm · 385 g |