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Electron Energy-Loss Spectroscopy in the Electron Microscope R.F. Egerton 3rd ed. 2011 edition
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Electron Energy-Loss Spectroscopy in the Electron Microscope
R.F. Egerton
Within the last 30 years, electron energy-loss spectroscopy (EELS) has become a standard analytical technique used in the transmission electron microscope to extract chemical and structural information down to the atomic level.
504 pages, 189 black & white illustrations, 26 colour illustrations
| Media | Bøker Innbunden bok (Bok med hard rygg og stivt omslag) |
| Utgitt | 29. juli 2011 |
| ISBN13 | 9781441995827 |
| Utgivere | Springer-Verlag New York Inc. |
| Antall sider | 491 |
| Mål | 155 × 235 × 33 mm · 1,02 kg |
| Språk | Engelsk |
![Cover for R.F. Egerton · Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM (Pocketbok) [Softcover reprint of the original 2nd ed. 2016 edition] (2018)](https://imusic.b-cdn.net/images/item/original/860/9783319819860.jpg?r-f-egerton-2018-physical-principles-of-electron-microscopy-an-introduction-to-tem-sem-and-aem-pocketbok&class=scaled&v=1611612371)
![Cover for R.F. Egerton · Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM (Innbunden bok) [2nd ed. 2016 edition] (2016)](https://imusic.b-cdn.net/images/item/original/761/9783319398761.jpg?r-f-egerton-2016-physical-principles-of-electron-microscopy-an-introduction-to-tem-sem-and-aem-innbunden-bok&class=scaled&v=1595770512)
![Cover for R.F. Egerton · Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM (Innbunden bok) [1st ed. 2005. Corr. 2nd printing 2011 edition] (2005)](https://imusic.b-cdn.net/images/item/original/003/9780387258003.jpg?r-f-egerton-2005-physical-principles-of-electron-microscopy-an-introduction-to-tem-sem-and-aem-innbunden-bok&class=scaled&v=1409902370)