Fortell venner om denne varen:
Aberration-corrected Imaging In Transmission Electron Microscopy: An Introduction (2nd Edition) Erni, Rolf (Swiss Federal Labs For Materials Science & Technology (Empa), Switzerland) 2. utgave
Pris
NOK 1.249
Bestillingsvarer
Forventes levert 24. des - 2. jan 2026
Julegaver kan byttes frem til 31. januar
Legg til iMusic ønskeliste
eller
Aberration-corrected Imaging In Transmission Electron Microscopy: An Introduction (2nd Edition)
Erni, Rolf (Swiss Federal Labs For Materials Science & Technology (Empa), Switzerland)
Aberration-Corrected Imaging in Transmission Electron Microscopy provides an introduction to aberration-corrected atomic-resolution electron microscopy imaging in materials and physical sciences.
350 pages
| Media | Bøker Innbunden bok (Bok med hard rygg og stivt omslag) |
| Utgitt | 18. mai 2015 |
| ISBN13 | 9781783265282 |
| Utgivere | Imperial College Press |
| Antall sider | 432 |
| Mål | 160 × 238 × 23 mm · 802 g |
| Språk | Engelsk |