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Nanometer-scale Defect Detection Using Polarized Light
Pierre-Richard Dahoo
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Nanometer-scale Defect Detection Using Polarized Light
Pierre-Richard Dahoo
This book describes the methods used to detect material defects at the nanoscale. The authors present different theories, polarization states and interactions of light with matter, in particular optical techniques using polarized light.
316 pages, black & white illustrations
| Media | Bøker Innbunden bok (Bok med hard rygg og stivt omslag) |
| Utgitt | 12. august 2016 |
| ISBN13 | 9781848219366 |
| Utgivere | ISTE Ltd and John Wiley & Sons Inc |
| Antall sider | 316 |
| Mål | 165 × 241 × 23 mm · 612 g |
