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Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM R.F. Egerton Softcover reprint of the original 2nd ed. 2016 edition
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Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM
R.F. Egerton
Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences.
196 pages, 15 Illustrations, color; 109 Illustrations, black and white; XI, 196 p. 124 illus., 15 il
| Media | Bøker Pocketbok (Bok med mykt omslag og limt rygg) |
| Utgitt | 30. mai 2018 |
| ISBN13 | 9783319819860 |
| Utgivere | Springer International Publishing AG |
| Antall sider | 196 |
| Mål | 234 × 156 × 16 mm · 334 g |
| Språk | Tysk |
![Cover for R.F. Egerton · Electron Energy-Loss Spectroscopy in the Electron Microscope (Pocketbok) [3rd ed. 2011 edition] (2014)](https://imusic.b-cdn.net/images/item/original/498/9781489986498.jpg?r-f-egerton-2014-electron-energy-loss-spectroscopy-in-the-electron-microscope-pocketbok&class=scaled&v=1539963116)
![Cover for R.F. Egerton · Electron Energy-Loss Spectroscopy in the Electron Microscope (Innbunden bok) [3rd ed. 2011 edition] (2011)](https://imusic.b-cdn.net/images/item/original/827/9781441995827.jpg?r-f-egerton-2011-electron-energy-loss-spectroscopy-in-the-electron-microscope-innbunden-bok&class=scaled&v=1544993799)