Lock-in Thermography: Basics and Use for Evaluating Electronic Devices and Materials - Springer Series in Advanced Microelectronics - Otwin Breitenstein - Bøker - Springer International Publishing AG - 9783319998244 - 22. januar 2019
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Lock-in Thermography: Basics and Use for Evaluating Electronic Devices and Materials - Springer Series in Advanced Microelectronics Third Edition 2018 edition

Otwin Breitenstein

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Lock-in Thermography: Basics and Use for Evaluating Electronic Devices and Materials - Springer Series in Advanced Microelectronics Third Edition 2018 edition

Reviewing various experimental approaches to LIT, particularly the commercial LIT systems available, this 3rd edition introduces new LIT applications, such as illuminated LIT applied to solar cells, non-thermal LIT lifetime mapping and LIT application to spin caloritronics problems.

321 pages, 68 Illustrations, color; 55 Illustrations, black and white; XVIII, 321 p. 123 illus., 68

Media Bøker     Innbunden bok   (Bok med hard rygg og stivt omslag)
Utgitt 22. januar 2019
ISBN13 9783319998244
Utgivere Springer International Publishing AG
Antall sider 321
Mål 657 g
Språk Tysk  

Se alt med Otwin Breitenstein ( f.eks. Innbunden bok og Pocketbok )