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Lock-in Thermography: Basics and Use for Evaluating Electronic Devices and Materials - Springer Series in Advanced Microelectronics 2nd ed. 2010 edition
Otwin Breitenstein
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Lock-in Thermography: Basics and Use for Evaluating Electronic Devices and Materials - Springer Series in Advanced Microelectronics 2nd ed. 2010 edition
Otwin Breitenstein
This is the first book on lock-in thermography, an analytical method applied to the diagnosis of microelectronic devices. This useful introduction and guide reviews various experimental approaches to lock-in thermography, with special emphasis on the lock-in IR thermography developed by the authors themselves.
250 pages, 56 black & white illustrations, 33 colour illustrations, biography
| Media | Bøker Innbunden bok (Bok med hard rygg og stivt omslag) |
| Utgitt | 5. september 2010 |
| ISBN13 | 9783642024160 |
| Utgivere | Springer-Verlag Berlin and Heidelberg Gm |
| Antall sider | 258 |
| Mål | 155 × 235 × 20 mm · 498 g |
| Språk | Fransk |
Se alt med Otwin Breitenstein ( f.eks. Innbunden bok og Pocketbok )