Lifetime Spectroscopy: A Method of Defect Characterization in Silicon for Photovoltaic Applications - Springer Series in Materials Science - Stefan Rein - Bøker - Springer-Verlag Berlin and Heidelberg Gm - 9783642064531 - 19. oktober 2010
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Lifetime Spectroscopy: A Method of Defect Characterization in Silicon for Photovoltaic Applications - Springer Series in Materials Science Softcover reprint of hardcover 1st ed. 2005 edition

Stefan Rein

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Lifetime Spectroscopy: A Method of Defect Characterization in Silicon for Photovoltaic Applications - Springer Series in Materials Science Softcover reprint of hardcover 1st ed. 2005 edition

Lifetime spectroscopy is one of the most sensitive diagnostic tools for the identification and analysis of impurities in semiconductors. This book introduces a transparent modeling procedure that allows a detailed theoretical evaluation of the spectroscopic potential of the different lifetime spectroscopic techniques.

492 pages, 29 black & white tables, biography

Media Bøker     Pocketbok   (Bok med mykt omslag og limt rygg)
Utgitt 19. oktober 2010
ISBN13 9783642064531
Utgivere Springer-Verlag Berlin and Heidelberg Gm
Antall sider 492
Mål 155 × 235 × 26 mm   ·   721 g
Språk Engelsk  
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