High Performance Gan Light-emitting Diode: a Reliability Study - Zonglin Li - Bøker - LAP LAMBERT Academic Publishing - 9783844395297 - 17. mai 2011
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Zonglin Li
High Performance Gan Light-emitting Diode: a Reliability Study

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The reliability of InGaN/GaN light emitting diodes (LEDs) with different emission wavelengths and different geometries was studied. Device performances, like current-voltage characteristics, 1/f noise spectrum, leakage, static resistance, were measured. The devices underwent a 1000-hr constant-current stress test and their optical output degradation rate was examined. The results were explained by cross-related data.

Media Bøker     Pocketbok   (Bok med mykt omslag og limt rygg)
Utgitt 17. mai 2011
ISBN13 9783844395297
Utgivere LAP LAMBERT Academic Publishing
Antall sider 80
Mål 150 × 5 × 226 mm   ·   137 g
Språk Tysk  

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