Electron Beam Testing Technology - Microdevices - John T L Thong - Bøker - Springer Science+Business Media - 9780306443602 - 31. juli 1993
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John T L Thong
Electron Beam Testing Technology - Microdevices 1993 edition

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Although exploratory and developmental activity in electron beam testing (EBT) 25 years, it was not had already been in existence in research laboratories for over until the beginning of the 1980s that it was taken up seriously as a technique for integrated circuit (IC) testing.

Marc Notes: Includes bibliographical references and index. Table of Contents: Background to Electron Beam Testing; W. C. Nixon. Introduction; J. T. L. Thong. Principles and Applications; J. T. L. Thong. Essential Electron Optics; A. R. Dinnis. Electron Beam Interaction with Specimen; K. Ura. Electron Spectrometers and Voltage Measurements; L. Dubbeldam. High Speed Techniques; J. T. L. Thong. Picosecond Photoemission Probing; H. Beha, R. Clauberg. Signal and Image Processing; F. M. Boland, E. R. Lynch. System Integration; M. Battu, et al. Practical Considerations in Electron Beam Testing; T. J. Aton. Industrial Case Studies; D. W. Ranasinghe, et al. Index."

Media Bøker     Innbunden bok   (Bok med hard rygg og stivt omslag)
Utgitt 31. juli 1993
ISBN13 9780306443602
Utgivere Springer Science+Business Media
Antall sider 462
Mål 178 × 254 × 32 mm   ·   1,05 kg
Redaktør Thong, John T.L.

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