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Focused Ion Beam Systems: Basics and Applications Nan Yao
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Focused Ion Beam Systems: Basics and Applications
Nan Yao
This edited volume, first published in 2007, comprehensively covers the focused ion beam and two beam technology. Presenting the basic principles, capabilities, challenges, advantages, applications and when best to implement the technology, this is a valuable resource for researchers in materials science, electrical engineering and nanotechnology.
408 pages, 196 b/w illus.
| Media | Bøker Innbunden bok (Bok med hard rygg og stivt omslag) |
| Utgitt | 13. september 2007 |
| ISBN13 | 9780521831994 |
| Utgivere | Cambridge University Press |
| Antall sider | 408 |
| Mål | 252 × 180 × 29 mm · 862 g |
| Språk | Engelsk |
| Redaktør | Yao, Nan (Princeton University, New Jersey) |
![Cover for Nan Yao · Handbook of Microscopy for Nanotechnology (Innbunden bok) [2005 edition] (2005)](https://imusic.b-cdn.net/images/item/original/036/9781402080036.jpg?nan-yao-2005-handbook-of-microscopy-for-nanotechnology-innbunden-bok&class=scaled&v=1605674268)
