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Introduction to Advanced System-on-Chip Test Design and Optimization - Frontiers in Electronic Testing 2005 edition
Erik Larsson
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Introduction to Advanced System-on-Chip Test Design and Optimization - Frontiers in Electronic Testing 2005 edition
Erik Larsson
SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. The second part of the book discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling.
388 pages, biography
| Media | Bøker Innbunden bok (Bok med hard rygg og stivt omslag) |
| Utgitt | 7. november 2005 |
| ISBN13 | 9781402032073 |
| Utgivere | Springer-Verlag New York Inc. |
| Antall sider | 388 |
| Mål | 156 × 232 × 23 mm · 1,09 kg |
| Språk | Engelsk |
Se alt med Erik Larsson ( f.eks. Innbunden bok , PDF og Pocketbok )