Erik Larsson
Introduction to Advanced System-on-Chip Test Design and Optimization - Frontiers in Electronic Testing Erik Larsson Softcover reprint of hardcover 1st ed. 2005 edition

Name: Introduction to Advanced System-on-Chip Test Design and Optimization - Frontiers in Electronic Testing
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Author: Erik Larsson

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2005 edition

(2005) NOK 1.479

Introduction to Advanced System-on-Chip Test Design and Optimization - Frontiers in Electronic Testing

Erik Larsson

Softcover reprint of hardcover 1st ed. 2005 edition

SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. The second part of the book discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling.

388 pages, biography

Media	Bøker Pocketbok (Bok med mykt omslag og limt rygg)
Utgitt	2. februar 2011
Opprinelig utgitt	2010
ISBN13	9781441952691
Utgivere	Springer-Verlag New York Inc.
Antall sider	388
Mål	150 × 220 × 10 mm · 571 g
Språk	Engelsk