Fortell venner om denne varen:
Analysis and Design of Resilient VLSI Circuits: Mitigating Soft Errors and Process Variations Rajesh Garg 2010 edition
Pris
NOK 1.759
Bestillingsvarer
Forventes levert 12. - 26. okt
Få varsel om nye utgivelser fra Rajesh Garg
Legg til iMusic ønskeliste
eller
Finnes også som:
Analysis and Design of Resilient VLSI Circuits: Mitigating Soft Errors and Process Variations
Rajesh Garg
This monograph is motivated by the challenges faced in designing reliable VLSI systems in modern VLSI processes. The work presented in this research mo- graph presents several analysis and design techniques with the goal of realizing VLSI circuits, which are radiation and process variation tolerant.
212 pages, 28 black & white tables, biography
| Media | Bøker Innbunden bok (Bok med hard rygg og stivt omslag) |
| Utgitt | 16. november 2009 |
| ISBN13 | 9781441909305 |
| Utgivere | Springer-Verlag New York Inc. |
| Antall sider | 212 |
| Mål | 159 × 238 × 24 mm · 508 g |
| Språk | Engelsk |