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High-Resolution X-Ray Scattering: From Thin Films to Lateral Nanostructures - Advanced Texts in Physics Ullrich Pietsch 2nd ed. 2004. Softcover reprint of the original 2n edition
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High-Resolution X-Ray Scattering: From Thin Films to Lateral Nanostructures - Advanced Texts in Physics
Ullrich Pietsch
During the last 20 years interest in high-resolution x-ray diffractometry and reflectivity has grown as a result of the development of the semiconductor industry and the increasing interest in material research of thin layers of magnetic, organic, and other materials.
408 pages, 389 black & white illustrations, biography
| Media | Bøker Pocketbok (Bok med mykt omslag og limt rygg) |
| Utgitt | 12. desember 2011 |
| ISBN13 | 9781441923073 |
| Utgivere | Springer-Verlag New York Inc. |
| Antall sider | 408 |
| Mål | 155 × 235 × 22 mm · 594 g |
| Språk | Engelsk |