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Lifetime Spectroscopy: A Method of Defect Characterization in Silicon for Photovoltaic Applications - Springer Series in Materials Science 2005 edition
Stefan Rein
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Lifetime Spectroscopy: A Method of Defect Characterization in Silicon for Photovoltaic Applications - Springer Series in Materials Science 2005 edition
Stefan Rein
Lifetime spectroscopy is one of the most sensitive diagnostic tools for the identification and analysis of impurities in semiconductors. This book introduces a transparent modeling procedure that allows a detailed theoretical evaluation of the spectroscopic potential of the different lifetime spectroscopic techniques.
492 pages, 29 black & white tables, biography
| Media | Bøker Innbunden bok (Bok med hard rygg og stivt omslag) |
| Utgitt | 23. juni 2005 |
| ISBN13 | 9783540253037 |
| Utgivere | Springer-Verlag Berlin and Heidelberg Gm |
| Antall sider | 492 |
| Mål | 241 × 166 × 37 mm · 839 g |
| Språk | Engelsk Tysk |
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