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Atomic Force Microscopy Based Nanorobotics: Modelling, Simulation, Setup Building and Experiments - Springer Tracts in Advanced Robotics Hui Xie 2011 edition
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Atomic Force Microscopy Based Nanorobotics: Modelling, Simulation, Setup Building and Experiments - Springer Tracts in Advanced Robotics
Hui Xie
The atomic force microscope (AFM) has been successfully used to perform nanorobotic manipulation operations on nanoscale entities such as particles, nanotubes, nanowires, nanocrystals, and DNA since 1990s.
360 pages, biography
| Media | Bøker Innbunden bok (Bok med hard rygg og stivt omslag) |
| Utgitt | 28. september 2011 |
| ISBN13 | 9783642203282 |
| Utgivere | Springer-Verlag Berlin and Heidelberg Gm |
| Antall sider | 344 |
| Mål | 155 × 235 × 25 mm · 612 g |
| Språk | Fransk |